【術科測驗】DSC/TGA術科考試、輪廓儀(Alpha-Step)術科、AFM學科/術科(C及B)考試
【術科考試】DSC/TGA術科考試、輪廓儀(Alpha-Step)術科、AFM學科/術科(C及B)考試
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事件： 報名DSC術科考試
- 報名時間: 2026/10/02-2026/11/09
- 考試時間: 2026/11/12-13：30起
- 考試地點: 104光電性質檢測實驗室
- 報名地點: 104光電性質檢測實驗室
1.凡報名參加此術科考試無故不到者，限制下次舉辦機台考試時不可參加。
2.每人限時5分鐘。
報名名單★有任何疑問請洽邱柏儒同學分機6330
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Event: Registration for the DSC Practical Exam
- Registration Period : 2026/10/02 – 2026/11/09
- Exam Date & Time : 2026/11/12, starting from 13:30
- Exam Venue : Room 104, Characterization of Optoelectronic properties Lab.
- Registration Venue : Room 104, Characterization of Optoelectronic properties Lab.
註:
- Candidates who register but fail to attend without valid reasons will not be allowed to participate in the next practical exam session.
- Each candidate will be given a time limit of 5 minutes.
Registration List
★ For any inquiries, please contact 邱柏儒, ext. 6330
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事件: 報名TGA術科考試
- 報名時間: 2026/10/02-2026/11/09
- 考試時間: 2026/11/12-13：30起
- 考試地點: 104光電性質檢測實驗室
- 報名地點: 104光電性質檢測實驗室
1.凡報名參加此術科考試無故不到者，限制下次舉辦機台考試時不可參加。
2.每人限時5分鐘。
報名名單★有任何疑問請洽鄧宏同學分機6330
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Event: Registration for the TGA Practical Exam
- Registration Period : 2026/10/02 – 2026/11/09
- Exam Date & Time : 2026/11/12, starting from 13:30
- Exam Venue : Room 104, Characterization of Optoelectronic properties Lab.
- Registration Venue : Room 104, Characterization of Optoelectronic properties Lab.
註:
- Candidates who register but fail to attend without valid reasons will not be allowed to participate in the next practical exam session.
- Each candidate will be given a time limit of 5 minutes.
Registration List
★ For any inquiries, please contact 邱柏儒, ext. 6330.
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事件: 報名輪廓儀(Alpha-Step)術科考試
- 報名時間: 2026/10/02-2026/10/16
- 考試時間:2026/10/20-13:00起
- 考試地點: 109-3 SEM實驗室
- 報名地點: 109-3 SEM實驗室
備註:
1. 凡報名參加此術科考試無故不到者，限制下次舉辦機台考試時不可參加
2. 每位考試操作時間為8分鐘
報名名單★有任何疑問請洽劉恩齊同學分機7514
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Event: Registration for the Alpha-Step Profilometer Practical Test
- Registration Period : 2026/10/02 – 2026/10/16
- Test Date : 2026/10/20, starting at 13:30
- Test Location : 109-3 SEM Laboratory
- Registration Location : 109-3 SEM Laboratory
Remarks:
1.Those who register for the test but fail to attend without a valid reason will not be allowed to participate in the next test session for this instrument.
2.Each participant will have 8 minutes for the operation test.
Registration List
★ For any inquiries, please contact劉恩齊ext. 7514.
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事件：報名AFM科目考試
- 報名日期：2026/10/02-2026/10/23
- 考試時間：2026/10/29-18:00-19:30
- 考試地點：待公佈
- 報名地點：307-1有機光電與納米能源實驗室
備註
1. 報名科目考試者，不可以無故不到，違反此規定停止一次考試。
★ 有任何疑問請洽王智霖同學分機6335
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事件：報名AFM-Tapping Mode C級術科考試(不含自行安裝激光Holder)
- 報名日期：2026/10/02-2026/11/09
- 考試時間：2026/11/12-13:30起
- 考試地點：139納米表面分析實驗室
- 報名地點：307-1有機光電與納米能源實驗室
備註
1.已修過＂納米檢測分析課程＂及已經通過學科測驗的同學，可免筆試(考試當日提出證明)，但仍要報名，未報名者視同放棄本次筆試。
2. 報名術科考試者，不可以無故不到，違反此規定停止一次考試。
★ 有任何疑問請洽王智霖同學分機6335
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事件：報名AFM-Tapping Mode B級術科考試
- 報名日期：2026/10/02-2026/11/23
- 考試時間：2026/11/26-13:30起
- 考試地點： 139 納米表面分析實驗室
- 報名地點：307-1有機光電與納米能源實驗室
備註
1.已修過＂納米檢測分析課程＂及已經通過學科測驗的同學，可免筆試(考試當日提出證明)，但仍要報名，未報名者視同放棄本次筆試。
2.報名術科考試者，不可以無故不到，違反此規定停止一次考試。
3.一律需通過C級後及經過10小時實際上機實際操作(需由B級陪同操作下)，方可報名B級術科考試，且考試需檢附B級操作認證單。
4.其他特殊模組(AFM- SPoM、CAFM、Contact術科)請與管理者聯繫考試時間。
★ 有任何疑問請洽王智霖同學分機6335
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Event: Registration for AFM Written Exam
- Registration Period: 2026/10/02-2026/10/23
- Exam Date and Time: 2026/10/29-18:00-19:30
- Exam Venue: To be announced
- Registration Venue: 307-1 Organic Optoelectronics and Nano Energy Lab
註:
- Candidates who register for the written exam must not be absent without a valid reason. Violation of this rule will result in suspension from one exam session.
★ For any inquiries, please contact王智霖at extension 6335.
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Event: Registration for AFM–Tapping Mode Class C Practical Exam (Laser Holder Installation Not Included)
- Registration Period: 2026/10/02-2026/11/09
- Exam Date and Time: 2026/11/12, starting from 13:30
- Exam Venue: 139 Nano Surface Analysis Laboratory
- Registration Venue: 307-1 Organic Optoelectronics and Nano Energy Laboratory
註:
- Students who have completed the Nano Characterization and Analysis course and have already passed the written exam may be exempted from the written test (proof must be provided on the exam day). However, registration sgard quired. test.
- Candidates who register for the practical exam must not be absent without a valid reason. Violation of this rule will result in suspension from one exam session.
★ For any inquiries, please contact王智霖at extension 6335.
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Event: Registration for AFM–Tapping Mode Class B Practical Exam
- Registration Period: 2026/10/02-2026/11/23
- Exam Date and Time: 2026/11/26, starting from 13:30
- Exam Venue: 139 Nano Surface Analysis Laboratory
- Registration Venue: 307-1 Organic Optoelectronics and Nano Energy Laboratory
註:
- Students who have completed the Nano Characterization and Analysis course and have already passed the written exam may be exempted from the written test (proof must be provided on the exam day). However, registration sgard quired. test.
- Candidates who register for the practical exam must not be absent without a valid reason. Violation of this rule will result in suspension from one exam session.
- Students must first pass the Class C exam and complete 10 hours of hands-on instrument operation (under the supervision of a Class B operator) before being eligible to register for the Class B practical exam。
- For other special modules (AFM-SPoM, CAFM, Contact Practical Exam), please contact the administrator to arrange the exam schedule.
★ For any inquiries, please contact 王智霖at extension 6335.
