事件：FE-SEM/EDS術科測驗(JEOL JSM 6701F)

報名日期：2026/09/29-2026/11/04

考試時間：2026/11/05-13：30起(測驗推桿)

2026/11/06 -13：30起(測驗操作)

考試地點：109-3 FE-SEM實驗室

報名地點：109電子顯微鏡實驗室

備註：

1.凡報名參加此次術科考試無故不到者，限制下次舉辦機台考試時不可參加。

2.必須通過SEM實機考試機台。

3.限研究生。

★有任何疑問請洽詢  蔡忠昀 同學 分機6329

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Event: FE-SEM/EDS Practical Examination (JEOL JSM 6701F)

Registration Period: 2026/09/29 – 2026/11/04

Examination Date:

-2026/11/05 – starting from 13:30 (Putting Test)

-2026/11/06 – starting from 13:30 (Operation Test)

Examination Venue: Room 109-3, FE-SEM Laboratory

Registration Venue: Room 109, Electron Microscopy Laboratory

Remarks:

1.     Those who register for this practical examination but fail to attend without valid reason will not be allowed to participate in the next scheduled instrument examination.

2.     Applicants must have passed the SEM hands-on instrument examination.

3.     Open to graduate students only.

★For any inquiries, please contact蔡忠昀at extension 6329.

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事件：報名 奈米壓痕儀(Nanoindenter) 術科考試

報名日期：2026/09/29-2026/11/10

考試時間：2026/11/13-13:30起      

考試地點：139奈米表面分析實驗室

報名地點：139奈米表面分析實驗室

備註：凡報名參加本次術科考試無故未到者，限制下次舉辦機台考試時不可參加。

★有任何疑問請洽詢 蔡忠昀 同學 分機6329

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Event: Nanoindenter Tester Practical Exam Registration

Registration Period: 2026/09/29-2026/11/10

Exam Date & Time: 2026/11/13, starting from 13:30

Exam Venue: 139 Nano Surface Analysis Laboratory

Registration Venue: 139 Nano Surface Analysis Laboratory

Remarks:

Any student who registers for this practical exam but fails to attend without a valid reason will be barred from participating in the next scheduled equipment certification exam.

Contact Information

★For any inquiries, please contact蔡忠昀at extension 6329