事件：報名AFM學科考試

報名日期：2026/07/23-2026/08/07

考試時間：2026/08/10-18:00-19:30

考試地點：待公佈

報名地點：307-1有機光電與奈米能源實驗室

備註

1.     報名學科考試者，不可以無故不到，違反此規定停止一次考試。

★有任何疑問請洽詢 王智霖同學 分機6335

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事件：報名AFM-Tapping Mode C級術科考試(不含自行安裝雷射Holder)

報名日期：2026/07/23-2026/08/14

考試時間：2026/08/17-13:00起      

考試地點：139奈米表面分析實驗室

報名地點：307-1有機光電與奈米能源實驗室

備註

1.已修過＂奈米檢測分析課程＂及已經通過學科測驗的同學，可免筆試(考試當日提出證明)，但仍然要報名，未報名者視同放棄本次筆試。

2. 報名術科考試者，不可以無故不到，違反此規定停止一次考試。

★有任何疑問請洽詢  王智霖同學 分機6335

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事件：報名AFM-Tapping Mode B級術科考試

報名日期：2026/07/23-2026/8/28

考試時間：2026/09/01-13:00起          

考試地點： 139奈米表面分析實驗室

報名地點：307-1有機光電與奈米能源實驗室

備註

1.已修過＂奈米檢測分析課程＂及已經通過學科測驗的同學，可免筆試(考試當日提出證明)，但仍然要報名，未報名者視同放棄本次筆試。

2.報名術科考試者，不可以無故不到，違反此規定停止一次考試。

3.一律需通過C級後及經過10小時實際上機實際操作(需由B級陪同操作下)，方可報名B級術科考試，且考試需檢附B級操作認證單。

4.其他特殊模組(AFM- SPoM、CAFM、Contact術科)請與管理者聯繫考試時間。

★有任何疑問請洽詢   王智霖同學 分機6335

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Event: Registration for AFM Written Exam

Notes:

1. Candidates who register for the written exam must not be absent without a valid reason. Violation of this rule will result in suspension from one exam session.

★For any inquiries, please contact王智霖at extension 6335.

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Event: Registration for AFM–Tapping Mode Class C Practical Exam (Laser Holder Installation Not Included)

Notes:

2. Students who have completed the Nano Characterization and Analysis course and have already passed the written exam may be exempted from the written test (proof must be provided on the exam day). However, registration is still required. Failure to register will be regarded as forfeiting the written test.

3. Candidates who register for the practical exam must not be absent without a valid reason. Violation of this rule will result in suspension from one exam session.

★For any inquiries, please contact王智霖 at extension 6335.

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Event: Registration for AFM–Tapping Mode Class B Practical Exam

Notes:

4. Students who have completed the Nano Characterization and Analysis course and have already passed the written exam may be exempted from the written test (proof must be provided on the exam day). However, registration is still required. Failure to register will be regarded as forfeiting the written test.

5. Candidates who register for the practical exam must not be absent without a valid reason. Violation of this rule will result in suspension from one exam session.

6. Students must first pass the Class C exam and complete 10 hours of hands-on instrument operation (under the supervision of a Class B operator) before being eligible to register for the Class B practical exam. In addition, a Class B operation certification form must be submitted on the exam day.

7. For other special modules (AFM-SPoM, CAFM, Contact Practical Exam), please contact the administrator to arrange the exam schedule.

★For any inquiries, please contact 王智霖 at extension 6335.

事件：拉曼(Raman)術科實機測驗

報名日期：2026/07/27-2026/08/14

考試時間：2026/8/20-13：30起

考試地點： 104 光電性質檢測實驗室

報名地點： 104 光電性質檢測實驗室

備註：

1.凡報名參加此次術科考試無故不到者，限制下次舉辦機台考試時不可參加。

★有任何疑問請洽詢 吳俊賢 同學 分機6336

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Event: Raman Practical Examination

Registration Period: 2026/07/27 – 2026/08/14
Exam Date: 2026/08/20 – starting from 13:30
Exam Venue: Room 104, Characterization of Optoelectronic properties Lab
Registration Venue: Room 104, Characterization of Optoelectronic properties Lab

Notes:

8. Those who register for this examination but fail to attend without valid reason will not be allowed to participate in the next instrument examination.

★For any inquiries, please contact吳俊賢at extension 6336